论文标题
芯片尺度的全孔光谱仪硅光子电路
Chip-scale Full-Stokes Spectropolarimeter in Silicon Photonic Circuits
论文作者
论文摘要
依赖波长的光的极化状态带有有关光物质相互作用的关键信息。但是,它的测量仅限于笨重的,消耗的设备,该设备禁止许多现代的便携式应用。在这里,我们提出并演示了使用CMOS兼容硅光子技术实施的芯片尺度光谱仪。四个紧凑型游标微孔子光谱仪单层与宽带偏振仪组成,该宽带偏振仪由2D纳米光天线和极化电路组成,以实现全孔光谱分析。所提出的设备提供了固态光谱极限溶液,较小的足迹为1*0.6 mm2,低功耗为360 mW}。在表征具有结构性手性的材料的表征中,证明了50 nm的宽光谱范围内的全孔光谱检测。所提出的设备可以在从生物医学诊断和化学分析到观察天文学的领域中更广泛的光谱法应用。
Wavelength-dependent polarization state of light carries crucial information about light-matter interactions. However, its measurement is limited to bulky, energy-consuming devices, which prohibits many modern, portable applications. Here, we propose and demonstrate a chip-scale spectropolarimeter implemented using a CMOS-compatible silicon photonics technology. Four compact Vernier microresonator spectrometers are monolithically integrated with a broadband polarimeter consisting of a 2D nanophotonic antenna and a polarimetric circuit to achieve full-Stokes spectropolarimetric analysis. The proposed device offers a solid-state spectropolarimetry solution with a small footprint of 1*0.6 mm2 and low power consumption of 360 mW}. Full-Stokes spectral detection across a broad spectral range of 50 nm with a resolution of 1~nm is demonstrated in characterizing a material possessing structural chirality. The proposed device may enable a broader application of spectropolarimetry in the fields ranging from biomedical diagnostics and chemical analysis to observational astronomy.