论文标题
通过Terahertz时域光谱探测的石墨烯中的Fermi速度重新归一化
Fermi velocity renormalization in graphene probed by terahertz time-domain spectroscopy
论文作者
论文摘要
我们证明了Terahertz时域光谱（THZ-TDS）是一种准确，快速和可扩展的方法，用于探测晶格载体中电荷载体的相互作用诱导的费米速度重新归一化νf^*。这允许通过THZ-TDS放置在任意底物上的大规模石墨烯膜的所有电参数（DC电导率σDC，载体密度N和载体迁移率μ）的定量提取。特别相关的是具有低相对介电常数（<5）的底物，例如聚合物膜，即使在相对较大的载流子密度（> 10^12 cm-2，费米水平> 0.1 eV）中，观察到明显的重新归一化效应。 From an application point of view, the ability to rapidly and non-destructively quantify and map the electrical (σDC, n, μ) and electronic (νF^* ) properties of large-scale graphene on generic substrates is key to utilize this material in applications such as metrology, flexible electronics as well as to monitor graphene transfers using polymers as handling layers.
We demonstrate terahertz time-domain spectroscopy (THz-TDS) to be an accurate, rapid and scalable method to probe the interaction-induced Fermi velocity renormalization νF^* of charge carriers in graphene. This allows the quantitative extraction of all electrical parameters (DC conductivity σDC, carrier density n, and carrier mobility μ) of large-scale graphene films placed on arbitrary substrates via THz-TDS. Particularly relevant are substrates with low relative permittivity (< 5) such as polymeric films, where notable renormalization effects are observed even at relatively large carrier densities (> 10^12 cm-2, Fermi level > 0.1 eV). From an application point of view, the ability to rapidly and non-destructively quantify and map the electrical (σDC, n, μ) and electronic (νF^* ) properties of large-scale graphene on generic substrates is key to utilize this material in applications such as metrology, flexible electronics as well as to monitor graphene transfers using polymers as handling layers.
