论文标题
将现场发射正统测试应用于墨菲好处
Applying the field emission orthodoxy test to Murphy-Good plots
论文作者
论文摘要
在现场电子发射（FE）研究中，使用适当绘制的电流 - 电压[i（v）]测量值检查和分析从样品获得的结果的质量和有效性很重要。对于传统的绘图方法，Fowler-Nordheim（FN）图上存在一个所谓的“正统测试”，可以应用于FN绘图，以检查FE设备/系统生成结果是否为“理想”。如果它不是理想的，则从FN图推导出的发射极特征参数可能是虚假的。最近引入了一种新形式的Fe I（V）数据图，即所谓的“ Murphy-Good（MG）图”（R.G. Forbes，Roy。Soc。6（2019）190912。这旨在提高特征值（尤其是正式排放区域）的特征值（尤其是fe Feel in Fe Feel In。 Millikan-Lauritsen（ML）形成，对斜率（因此比例缩放）的一致性进行独立评估，可以从MG图中提取，通过使用修订的公式来提取缩放的场景，可以将现有的正态测试应用于所有形式。 FE数据图（ML，MG和FN）。
In field electron emission (FE) studies, it is important to check and analyse the quality and validity of results experimentally obtained from samples, using suitably plotted current-voltage [I(V)] measurements. For the traditional plotting method, the Fowler-Nordheim (FN) plot, there exists a so-called "orthodoxy test" that can be applied to the FN plot, in order to check whether the FE device/system generating the results is "ideal". If it is not ideal, then emitter characterization parameters deduced from the FN plot are likely to be spurious. A new form of FE I(V) data plot, the so-called "Murphy-Good (MG) plot" has recently been introduced (R.G. Forbes, Roy. Soc. Open Sci. 6 (2019) 190912. This aims to improve the precision with which characterization-parameter values (particularly values of formal emission area) can be extracted from FE I(V) data. The present paper compares this new plotting form with the older FN and Millikan-Lauritsen (ML) forms, and makes an independent assessment of the consistency with which slope (and hence scaled-field) estimates can be extracted from a MG plot. It is shown that, by using a revised formula for the extraction of scaled-field values, the existing orthodoxy test can be applied to Murphy-Good plots. The development is reported of a prototype web tool that can apply the orthodoxy test to all three forms of FE data plot (ML, MG and FN).
