论文标题

用于辐射束轮廓测量的像素化硅检测器

Pixelated silicon detector for radiation beam profile measurements

论文作者

Tikkanen, Joonas, Kirschenmann, Stefanie, Kramarenko, Nikita, Brücken, Erik, Koponen, Pirkitta, Luukka, Panja, Siiskonen, Teemu, Turpeinen, Raimo, Ott, Jennifer

论文摘要

最初用于粒子物理实验的像素化硅检测器用于水幻影中的CO-60辐射器的光束曲线测量。将梁曲线与用精确电离室测量的轮廓进行比较。像素探测器和精确腔室相对谱的差异在大约0.02之内,在用蒙特卡洛模拟计算校正因子的像素探测器的校正因子后,差异降低到几乎低于0.005。检测器测量脉冲高度的能力用于记录Co-60梁中水中的电子脉冲高光谱,结果与模拟良好一致。

A pixelated silicon detector, developed originally for particle physics experiments, was used for a beam profile measurement of a Co-60 irradiator in a water phantom. The beam profile was compared to a profile measured with a pinpoint ionization chamber. The differences in the pixel detector and pinpoint chamber relative profiles were within approximately 0.02, and after calculating correction factors with Monte Carlo simulations for the pixel detector, the differences were decreased to almost less than 0.005. The detector's capability to measure pulse-height was used to record an electron pulse-height spectrum in water in the Co-60 beam, and the results agreed well with simulations.

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